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EE6309 - VLSI Systems

AY23/24 Semester 2 Assignment#1

Due Date: 6PM on 15 March (Friday) 2024 (Submission to S2-b2b-42 in Hardcopy)

Answer the following questions.

1)  Assume that one of the NMOS devices in the boxed NAND2 in Figure 1 has stuck-open fault. Explain how to detect the suck-open fault.

Figure 1

Figure 2

2)  Derive all the test vectors that can detect the stuck-at fault indicated in Figure 2.

(10 Marks)

3)  Among the test vectors derived in 2), which test vector shows the highest fault coverage?

(20 Marks)

4)  A sequential circuit with 2 inputs (A and B), 2-bit state memory, and 1 output (OUT) shown below needs to be tested. Find the sequence of the input vectors for testing the stuck-at fault indicated in the following sequential circuit. Assume that the initial state of the circuit is (Q1, Q2) = (0, 0). Can you reduce the number of the input vector sequence? Explain briefly.

Figure 3

7)  A BIST circuit is analyzing the signature of the input data stream (MSB)(101010110)(LSB) using Linear Feedback Shift Register (LFSR). The characteristic polynomial of the LFSR is x4  + x2  + 1. Draw the circuit diagram of the LFSR and calculate the signature of this test.

(10 Marks)